ANT — RF Technology Antenna / Microwave Anechoic Chamber
RF Technology Antenna Chamber — Near Field, Far Field, Compact Range/RCS, and Complex EM Environment configurations for antenna, radar, and satellite testing. Turnkey by Finch.
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Overview
The RF Technology Antenna Chamber range provides specialist microwave anechoic environments for antenna measurement, radar, and high-frequency electromagnetic testing. The range includes Near Field Testing Chambers, Far Field Testing Chambers, and Compact Range/RCS Testing Chambers, each tailored to specific antenna measurement methodologies.
Near Field Chambers collect near-field amplitude and phase data and derive far-field radiation characteristics through mathematical transformation, accommodating planar, cylindrical, and spherical near-field scanning configurations. Far Field Chambers provide direct far-field antenna pattern measurement at sufficient separation distance. Compact Range Chambers use a precision parabolic reflector to create a planar wave in a compact space, enabling far-field testing of large antennas and RCS measurements of aircraft, satellites, and vehicles in a much smaller facility.
All chambers feature dense microwave absorber treatment for high performance at millimetre-wave frequencies, with shielding construction and door systems appropriate to the test requirement. Suitable for 5G millimetre-wave antenna testing, satellite payload testing, radar system characterisation, and high-performance antenna R&D. Supplied and installed in Australia by Finch Electronic Solutions.
Key Specifications
Configurations: Near Field / Far Field / Compact Range (RCS) / Complex EM Environment | Microwave absorber treatment | Custom frequency range and quiet zone | Shielding: pan-type galvanised steel | Custom dimensions on enquiry
ANT Configurations
The Antenna Chamber range is tailored to specific antenna measurement methodologies.
| Model | Configuration | Method | |
|---|---|---|---|
| ANT-NF | Near Field Testing Chamber | Planar, cylindrical, spherical near-field scanning | Base model |
| ANT-FF | Far Field Testing Chamber | Direct far-field antenna pattern measurement | Alternative config |
| ANT-CR | Compact Range / RCS Chamber | Planar wave generation for large-antenna and RCS testing | Alternative config |
| ANT-CEMS | Complex EM Environment Chamber | Complex electromagnetic environment simulation | Alternative config |
Features
- Near Field Chamber: planar, cylindrical, and spherical scanning configurations
- Far Field Chamber: direct far-field antenna pattern measurement
- Compact Range/RCS Chamber: planar wave generation for large-antenna and RCS testing
- Suitable for 5G mmWave, satellite, radar, and high-frequency antenna measurement
- Dense microwave absorber treatment for high performance at mmWave frequencies
- Shielding and door systems to suit measurement methodology
- Custom sizing and absorber specification available
- Turnkey supply and installation by Finch Electronic Solutions
Applications
Antenna radiation pattern measurement; Antenna gain, directivity, and efficiency characterisation; Near-field to far-field transformation; Radar Cross Section (RCS) measurement; 5G millimetre-wave antenna testing; Satellite antenna and payload testing; Compact range system testing for large aperture antennas; Whole-satellite star testing; Aircraft scattering characteristics measurement