SMT-950K Test Probe Kit for UL / IEC 60950-1
LISUN SMT-950K probe kit for IT equipment safety testing to UL 60950-1 and IEC 60950-1: jointed and rigid test fingers, test pin, test probe, 500g steel ball and wedge probe.
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Overview
The SMT-950K brings together the probes called up in UL 60950-1 and IEC 60950-1 for information technology equipment: the jointed test finger and test pin for checking access to hazardous parts through openings, the test probe for operator-access areas, the wedge probe for gaps and seams, and the 50mm / 500g steel ball for impact testing of enclosures.
IEC 60950-1 has been replaced by IEC 62368-1 for new designs in most markets, but many laboratories still test legacy products or follow customer specifications that reference it. For IEC 62368-1 work, see the SMT-0368K kit.
Key Specifications
| LISUN model | Item |
|---|---|
| SMT-02T10 | Jointed test finger (Fig. 2A) |
| SMT-1150 | Rigid test finger |
| SMT-1213 | Test pin (Fig. 2B) |
| SMT-TD15 | Test probe (Fig. 2C) |
| SMT-B50H | 50mm / 500g steel ball (Fig. 4A) |
| SMT-S113 | Wedge probe |
Features
- Six probes covering access, operator-area and impact tests
- Made to UL 60950-1 / IEC 60950-1 figures
- Each probe also available individually
Applications
Safety testing of IT equipment, power supplies and office equipment to legacy 60950-1 requirements; customer-specified and grandfathered product testing.