LISUN CDM ESD Test System
LISUN CDM ESD Test System — Charged Device Model ESD testing for ICs and semiconductor components per ANSI/ESDA/JEDEC JS-002. For semiconductor and electronics manufacturing ESD qualification.
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Overview
The Charged Device Model (CDM) ESD Test System is designed for ESD sensitivity testing of integrated circuits and semiconductor components per ANSI/ESDA/JEDEC JS-002. CDM testing simulates the ESD discharge scenario where the device itself becomes charged and then discharges through a metallic contact — a common ESD failure mechanism in semiconductor manufacturing. Used by semiconductor manufacturers and test laboratories for IC ESD qualification.
Key Specifications
ESD model: Charged Device Model (CDM) | Standard: ANSI/ESDA/JEDEC JS-002 | Application: IC and semiconductor ESD qualification
Features
- CDM ESD testing for ICs and semiconductor components
- Anti/ESDA/JEDEC JS-002 compliant
- Simulates device-level CDM discharge scenarios
- For semiconductor manufacturing quality control
Applications
IC ESD sensitivity qualification; Semiconductor component CDM testing; Electronics manufacturing ESD control; JEDEC JS-002 compliance